Funct. Mater. 2015; 22 (4): 487-493.

http://dx.doi.org/10.15407/fm22.04.487

Effect of substrate temperature on structural and substructural properties of MgO thin films

O.V.Diachenko1,3, A.S.Opanasuyk1, D.I.Kurbatov1, V.M.Kuznetsov2, H.Cheong3

[1] Sumy State University, 2 Rymsky-Korsakov Str., 40007 Sumy, Ukraine
[2] Institute of Applied Physics, National Academy of Sciences of Ukraine, 58 Petropavliska Str., 40030 Sumy, Ukraine
[3] Department of Physics, Sogang University, Seoul 121-742, South Korea

Abstract: 

In this paper we have studied the influence of substrate temperature deposition on structural and substructural characteristics of magnesium oxide films by X-ray diffraction analysis. The thin films of MgO were prepared by spray pyrolysis technique from magnesium chloride solution. We have established the phase composition, the lattice constant, coherent scattering domain size, microstrain level of the films. The optimal conditions for the application of the homogeneous single-phase films of stoichiometric composition were identified.

Keywords: 
magnesium oxide, spray pyrolysis technique, X-ray diffraction analysis, substructural characteristics, coherent scattering domain size, microstrain.
References: 

1. W.B.Wang, Y.Yang, A.Yanguas-Gil et al., Appl. Phys. Lett., 102, 101605 (2013). http://dx.doi.org/10.1063/1.4795860

2. A.V.Dyachenko, A.S.Opanasuyk, D.I.Kurbatov et al., in: Proc. Intern. Conf. Nanomaterials: Applications and Properties 3, 01001 (2014).

3. S.S.P.Parkin, C.Kaiser, A.Panchula et al., Nat. Mater., 3, 862 (2004). http://dx.doi.org/10.1038/nmat1256

4. S.Ikeda, K.Miura, H.Yamamoto et al., Nat. Mater., 9, 721 (2010). http://dx.doi.org/10.1038/nmat2804

5. Y.B.Li, Y.Bando, T.Sato, Chem. Phys. Lett., 359, 141 (2002). http://dx.doi.org/10.1016/S0009-2614(02)00672-3

6. E.Fujiia, A.Tomozawaa et al., Thin Solid Films, 352, 85 (1999). http://dx.doi.org/10.1016/S0040-6090(99)00343-0

7. J.Kim, B.P.Gila, R.Mehandru et al., in: Proc. Res. Soc. Symposium (2002), p.690.

8. Y.Peidong, C.M.Lieber, Science, 273, 1836 (1996). http://dx.doi.org/10.1126/science.273.5283.1836

9. C.J.Panchal, A.S.Opanasyuk, V.V.Kosyak et al., J. Nano-Electron. Phys., 3(1), 274 (2011).

10. M.Li, X.Wang, H.Li et al., Appl. Surf. Sci., 274, 188 (2013). http://dx.doi.org/10.1016/j.apsusc.2013.03.013

11. K.Hayashi, S.Matsuishi, T.Kamiya et al., Nature, 419, 462 (2002). http://dx.doi.org/10.1038/nature01053

12. J.Senzaki, K.Kurihara et al., J. Appl. Phys., 37, 5150 (1998). http://dx.doi.org/10.1143/JJAP.37.5150

13. M.Nashimoto, K.Nashimoto, J. Appl. Phys., 33, L793 (1994). http://dx.doi.org/10.1143/JJAP.33.L793

14. D.K.Fork, F.A.Ponce et al., Appl. Phys. Lett., 58, 2294 (1991). http://dx.doi.org/10.1063/1.104903

15. S.K.Ram, U.K.Barik, S.Sarkar et al., Thin Solid Films, 517, 6252 (2009). http://dx.doi.org/10.1016/j.tsf.2009.02.111

16. O.Stryckmans, T.Segato, P.H.Duvigneaud, Thin Solid Films, 283, 17 (1996). http://dx.doi.org/10.1016/0040-6090(95)08154-2

17. A.Moses Ezhil Raj, L.C.Nehru, M.Jayachandran, C.Sanjeeviraja, Cryst. Res. Technol., 42, 867 (2007). http://dx.doi.org/10.1002/crat.200710918

18. J.M.Bian, X.M.Li, T.L.Chen et al., Appl. Surf. Sci., 228, 297 (2004). http://dx.doi.org/10.1016/j.apsusc.2004.01.020

19. X.Fu, G.Wu, S.Song et al., Appl. Surf. Sci., 148, 223 (1999). http://dx.doi.org/10.1016/S0169-4332(99)00126-9

20. X.Yi, W.Wenzhong, Q.Yitai et al., Surf. Coat. Techn., 82, 291 (1996). http://dx.doi.org/10.1016/0257-8972(95)02762-9

21. S.G.Kim, J.Y.Kim, H.J.Kim, Thin Solid Films, 376, 110 (2000). http://dx.doi.org/10.1016/S0040-6090(00)01186-X

22. O.Dobrozhan, D.Kurbatov, A.Opanasyuk et al., Surf. Interface Anal., 47, 601 (2015). http://dx.doi.org/10.1002/sia.5752

23. Selected Powder Diffraction Data for Education Straining. Search Manual and Data Cards, USA: International Centre for Diffraction Data (1997).

24. D.Kurbatov, V.Kosyak, M.Kolesnyk et al., Integrated Ferroelectrics, 103, 1 (2009).

25. Ja.S.Umanskij, Ju.A.Skakov, A.N.Ivanov, L.N.Rastorgujev, Crystallogaphy, X-ray Graph and Electronmicroscopy, Moscow (1982) (in Russian).

26. B.E.Warren, X-ray Diffraction, Dover, New York (1990).

27. W.J.De Sisto, R.L.Henry, J. Cryst. Growth, 109, 314 (1991). http://dx.doi.org/10.1016/0022-0248(91)90197-D

28. O.Yeheskel, R.Chaim, Z.Shen, M.Nygren, J. Mater. Res., 20, 719 (2005). http://dx.doi.org/10.1557/JMR.2005.0094

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