I.A.Klimenko*, V.K.Komar, V.P.Migal*,
D.P.Nalivaiko*
Received November 14, 1999
The relaxation character of photodielectric response in piezoelectric
CdZnTe crystals is closely connected with elastic and electric
fields of growth structure defects. The features of low frequency
dependences of a complex dielectric constant on frequency, wavelength,
temperature and coordinate are determined. In each of the diagrams
epsilon*(lambda), epsilon*(T) and
epsilon*(omega
) the character of internal fields generated
by structure defects is represented individually. The analysis of
these diagrams allows to identify three types of growth nonuniformities
and show their distribution over the sample.