The In flux density effect on the structure and properties of Cu-In-Se thin films obtained by low-energy ion-molecular beam technique

V.Gnidash, B.Boyko, V.Kopach, G.Khripunov


Kharkiv State Polytechnic University, 21 Frunze St., 61002 Kharkiv, Ukraine

Received April 1, 1999

A series of Cu-In-Se system thin films were deposited by Low-Energy Ion-Molecular Beam technique (LE IMB). The influence of In incident flux density on the structure and properties of Cu-In-Se thin films has been investigated. An attempt to create CuInSe2/CuIn3Se5 base structure for thin film solar cell was made. P-i-n and p-i-p+-n heterojunctions have been prepared and analyzed in three of eight series of Cu-In-Se samples.

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