Spectral and luminescence studies of materials intended for emitters of organic light emitting diodes

O.S.Pyshkin, N.I.Voronkina*, A.G.Fedorov*, B.M.Krasovitsky*, L.M.Buravtseva, K.B.Vodolazhsky*, I.Sokolik**, A.A.Avdeenko

B.I.Verkin Institute for Low Temperature Physics and Engineering, National Academy of Sciences of Ukraine, 47 Lenin Ave., 310164 Kharkiv, Ukraine
*Institute for Single Crystals, National Academy of Sciences of Ukraine, 60 Lenin Ave., 310001 Kharkiv, Ukraine
**FED Corporation, Hopewell Junction, NY 12533, USA

Received October 14, 1998

The absolute photoluminescence quantum yield measuring procedure has been described for a series of materials intended for emitters of organic light emitting diodes using the Ulbricht globe photometer. Both powders and films obtained by various methods (spin-coating, Langmuire-Blodgett technique, vacuum deposition) were studied. It has been shown that the simultaneous use of two methods to measure absolute luminescence quantum yields using the Ulbricht photometer allows not only determine the proper luminescence parameters of a material but also establish the influence of various factors on those parameters.

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